Please use this identifier to cite or link to this item: https://elib.vku.udn.vn/handle/123456789/5788
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dc.contributor.authorCao, Thi Nham-
dc.contributor.authorNguyen, Nhut Tien-
dc.contributor.authorNguyen, Thanh Binh-
dc.date.accessioned2025-11-11T04:34:34Z-
dc.date.available2025-11-11T04:34:34Z-
dc.date.issued2025-04-
dc.identifier.isbn978-981-96-4285-4-
dc.identifier.isbn978-981-96-4284-7-
dc.identifier.urihttps://doi.org/10.1007/978-981-96-4285-4_39-
dc.identifier.urihttps://elib.vku.udn.vn/handle/123456789/5788-
dc.descriptionCommunications in Computer and Information Science (CCIS); Volume 2351; pp: 490–501vi_VN
dc.description.abstractDebugging is a critical, costly, and labor-intensive activity in software development. Many fault localization techniques have been proposed to mitigate this issue. Spectrum-based fault localization is a widely used technique that analyzes execution traces (spectra) from test cases and applies a ranking formula to determine the suspiciousness score of each program unit. However, most of the existing spectrum-based fault localization techniques fail to consider complex dependencies between program units and test results. To overcome this limitation, deep-learning-based fault localization techniques have been developed, which utilize artificial neural networks to capture and learn the complex nonlinear relationships between the program spectra and test results. In this study, we propose an effective framework integrating the Variational Autoencoder and Residual Neural Networks (ResNet) to enhance the accuracy of fault localization. First, VAE handles imbalanced input data, and then ResNet networks capture nonlinear relationships in program execution data. Experimental results show that our approach outperforms state-of-the-art techniques in terms of EXAM and RImp metrics.vi_VN
dc.language.isoenvi_VN
dc.publisherSpringer Naturevi_VN
dc.subjectFault Localizationvi_VN
dc.subjectResNetvi_VN
dc.subjectVariational Autoencodervi_VN
dc.subjectDeep Learningvi_VN
dc.titleEnhancing Software Fault Localization with Variational Autoencoder and Residual Neural Networksvi_VN
dc.typeWorking Papervi_VN
Appears in Collections:NĂM 2025

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