Please use this identifier to cite or link to this item: https://elib.vku.udn.vn/handle/123456789/5787
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dc.contributor.authorDo, Van Nho-
dc.contributor.authorTran, Giang T.C-
dc.contributor.authorNguyen, Duc Thuan-
dc.contributor.authorNguyen, Thi Ngoc Anh-
dc.contributor.authorNguyen, Quang Vu-
dc.contributor.authorNguyen, Thanh Binh-
dc.date.accessioned2025-11-11T04:28:34Z-
dc.date.available2025-11-11T04:28:34Z-
dc.date.issued2024-12-
dc.identifier.issn1859-3534-
dc.identifier.urihttps://doi.org/10.32913/mic-ict-research.v2024.n2.1277-
dc.identifier.urihttps://elib.vku.udn.vn/handle/123456789/5787-
dc.descriptionJournal on Information Technologies & Communications; Vol 2025 No 1; pp: 19-27vi_VN
dc.description.abstractHigh-order mutation (HOM) testing is a rigorous technique for evaluating the effectiveness of test suites by introducing mutations with multiple concurrent faults into the source code. In this study, we present the development and analysis of a comprehensive dataset tailored for HOM testing purposes. The dataset comprises 2,839,792 instances categorized into Survived and Killed classes, representing instances correctly identified as surviving and not surviving the mutation testing process, respectively. We employ four prominent machine learning algorithms—Logistic Regression, Random Forest Classifier, LightGBM, and XGBoost—to classify instances within these categories. Experimental results demonstrate varying levels of accuracy, precision, recall, and F1-score across the algorithms, with LightGBM and XGBoost exhibiting superior performance. These findings underscore the importance of high-quality datasets in facilitating effective HOM testing and provide valuable insights into the capabilities of machine learning algorithms in this context.vi_VN
dc.language.isoenvi_VN
dc.publisherJournal on Information Technologies & Communicationsvi_VN
dc.subjectHigh order mutation testingvi_VN
dc.subjectDatavi_VN
dc.subjectdatasetvi_VN
dc.subjectdata generationvi_VN
dc.subjectmachine learningvi_VN
dc.titleA Rich High-Order Mutation Testing Dataset for Software Fortificationvi_VN
dc.typeWorking Papervi_VN
Appears in Collections:NĂM 2024

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