Please use this identifier to cite or link to this item:
https://elib.vku.udn.vn/handle/123456789/6024Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Shojiro, Asai | - |
| dc.date.accessioned | 2025-12-08T23:02:22Z | - |
| dc.date.available | 2025-12-08T23:02:22Z | - |
| dc.date.issued | 2019 | - |
| dc.identifier.isbn | 978-4-431-56594-9 | - |
| dc.identifier.uri | https://doi.org/10.1007/978-4-431-56594-9 | - |
| dc.identifier.uri | https://elib.vku.udn.vn/handle/123456789/6024 | - |
| dc.description | pp: 792. | vi_VN |
| dc.language.iso | en | vi_VN |
| dc.publisher | Springer Nature | vi_VN |
| dc.subject | VLSI Design | vi_VN |
| dc.subject | Systems | vi_VN |
| dc.title | VLSI Design and Test for Systems Dependability | vi_VN |
| dc.type | Book | vi_VN |
| Appears in Collections: | Vi mạch bán dẫn | |
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