Please use this identifier to cite or link to this item: https://elib.vku.udn.vn/handle/123456789/7670
Title: Improving Machine Learning-based Test Smell Prediction using Data Processing Techniques
Authors: Huynh, Ngoc Khoa
Le, Huu Nghia
Dang, Thien Binh
Nguyen, Thanh Binh
Keywords: Test Smell
Test Smell Prediction
Machine Learning
Data Balancing
Feature Selection
Issue Date: Nov-2025
Publisher: Science, Technology and Communications Publishing House
Abstract: Test smells are indicative symptoms of poor design choices or bad implementations in test code, potentially reducing maintainability and compromising test effectiveness. Although machine learning-based approaches have been proposed to automate test smell detection, their predictive performance remains limited due to severe class imbalance and the presence of redundant or irrelevant features. This study presents an integrated framework that combines data balancing techniques with feature selection methods to enhance model accuracy. Specifically, four data balancing techniques, namely Random Undersampling, NearMiss-3, Random Oversampling, and Borderline SMOTE, are applied alongside two feature selection methods, Chi-Square and Lasso Regression. Predictive models are built using four widely used machine learning algorithms, including Random Forest, K-Nearest Neighbors, Support Vector Machine, and Extreme Gradient Boosting, and evaluated on a benchmark dataset comprising two test smells: Mystery Guest and Duplicate Assert. Experimental results demonstrate substantial improvements in key metrics, especially F1-score, and AUC-PR, in which Random Forest consistently outperforms other classifiers, achieving F1-scores of 0.868 and 0.869 for the two test smells, respectively. The findings also confirm that oversampling methods are generally more effective than undersampling in addressing data imbalance.
Description: Hội thảo quốc gia lần thứ XXVIII: Một số vấn đề chọn lọc của Công nghệ thông tin và truyền thông (@2025); pp: 398-405
URI: https://elib.vku.udn.vn/handle/123456789/7670
Appears in Collections:NĂM 2025

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