Please use this identifier to cite or link to this item:
https://elib.vku.udn.vn/handle/123456789/6244Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ashok, K. Sharma | - |
| dc.date.accessioned | 2026-02-04T07:18:42Z | - |
| dc.date.available | 2026-02-04T07:18:42Z | - |
| dc.date.issued | 1997 | - |
| dc.identifier.isbn | 0-7803-1000-4 | - |
| dc.identifier.uri | https://elib.vku.udn.vn/handle/123456789/6244 | - |
| dc.description | pp: 473 | vi_VN |
| dc.language.iso | en | vi_VN |
| dc.publisher | Wiley | vi_VN |
| dc.subject | Semiconductor Memories | vi_VN |
| dc.title | Semiconductor Memories: Technology, Testing, and Reliability | vi_VN |
| dc.type | Book | vi_VN |
| Appears in Collections: | Thiết kế Vi mạch bán dẫn | |
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