Please use this identifier to cite or link to this item:
https://elib.vku.udn.vn/handle/123456789/6244| Title: | Semiconductor Memories: Technology, Testing, and Reliability |
| Authors: | Ashok, K. Sharma |
| Keywords: | Semiconductor Memories |
| Issue Date: | 1997 |
| Publisher: | Wiley |
| Description: | pp: 473 |
| URI: | https://elib.vku.udn.vn/handle/123456789/6244 |
| ISBN: | 0-7803-1000-4 |
| Appears in Collections: | Thiết kế Vi mạch bán dẫn |
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